GOM Conference 2012 set a further milestone within optical metrology

Optical Metrology 2012
Optical Metrology 2012
Optical Metrology 2012
Optical Metrology 2012
Optical Metrology 2012

For the 10th time GOM held the Optical Metrology conference in Braunschweig, Germany. More than 600 participants from 40 countries accepted the invitation to this year´s GOM Conference, which took place from June 18th till June 21st.

The visitors could attend an international lecture program with presentations covering optical measurement methods in industrial process chains. Additionally industry specific workshops and live demonstrations accompanied the technical exhibition.

Speakers included representatives from Airbus, BMW, Samsung, Volkswagen, Opel, Rolls Royce, Snecma, Eurocopter, Novo Nordisk and also NASA.

The presentations and discussions with decision makers from industry and research institutes suggest that tactile metrology will be further replaced by optical technology in future. The industry leading companies are investing more heavily in new measuring technology and on increased strategic implementation the optical metrology was seen.

Furthermore the automated inspection becomes increasingly important in the future. In this field GOM presented the new milestones for shape and dimensional control. The GOM expert team which is dedicated to automation tasks has gained extensive experiences with individual project cells within the last years. In understanding market requirements GOM now offers a standardized optical 3D measuring machine, the ATOS ScanBox. This complete plug and play solution incorporates software and hardware required for automated digitizing and inspection.

The GOM Conference also focused on software solutions. GOM Inspect Professional and GOM Inspect include new inspection tools for blisk and blade analysis, which are important for power generation & propulsion as well as for aerospace industries. A newly developed Trend Module enables a very simply analysis of multiple parts and small series within GOM Inspect Professional.

This year the GOM conference has been once again highly successful. Special thanks are directed to all participants, GOM partners and speakers, who were substantially involved in making the conference a success.

We are looking forward to welcoming worldwide leading decision makers and experts to the next GOM Conference.

For more details please visit www.gom-conference.com.