Representatives, among others from Baosteel, Novelis, SAIC and Yanfeng, demonstrated how the use of optical 3D metrology in the application field materials and component testing reduces development times and optimizes production processes in their company.
GOM’s presentation topics included, among others, the representation of the new ARAMIS system and the new GOM software version V8 SR1 that provides a newly developed software for testing applications. The release of the new software is scheduled for mid-January 2016.
The live demonstrations highlighted optical metrology as a fast, accurate and reliable tool for optimizing production processes and quality assurance. In addition, the attendees had the opportunity to exchange experiences with GOM's metrology experts about the whole product range of GOM. Beyond that, third-party companies exhibited high-speed cameras like PHOTRON and NAC.
After the event, many visitors attended a software training session and learned how to use the new GOM software. This way, the attendees gained an insight into the complete range of the new features.
Many thanks go to the speakers and to all guests for their contribution to a successful event. We would also like to thank our partner DOM 3D for their professional organization and are already looking forward to the next user meeting in China.