Optical Metrology 2009 is an international conference for integration of optical measuring techniques in industry and research. The Optical Metrology Conference is a unique event in bringing industry leaders together. Our goal is to offer a platform for managers, metrologists, technology and research experts to exchange experiences about the integration of optical measuring techniques.
Optical Metrology 2009 is split into two conferences
in Material, Component Testing and 3D Motion Analysis
1pm 25.05. until 1pm 26.05.2009
in Quality Control, Inspection and Reverse Engineering
1pm 27.05. until 1pm 28.05.2009
The application of quality control, rapid manufacturing, reverse engineering, material and component testing and 3D motion analysis will be presented from the industry by
ABB, Airbus, Audi, Ford, Gienanth, Hörmann, NASA, Salzgitter Mannesmann, Skoda Auto, Volkswagen, ...
and research facilities like
IPF Dresden, LFT Erlangen, Technical University Munich, Technical University of Denmark, University Groningen, University of Poznan, ...
Take a look at the complete overview of all presenting companies and their interesting contributions.