Our partner OMA provided the participants with a comprehensive overview of the wide range of GOM metrology systems. Live demonstrations illustrated the processes of the digitized measuring solutions ATOS Triple Scan, ATOS Core, ATOS Compact Scan and the automated ATOS ScanBox. The GOM Inspect Professional software was also presented. In addition, the ARAMIS, ARGUS and PONTOS systems were demonstrated live as solutions for testing.
Companies from research and industry highlighted the many areas of application for GOM metrology systems in user presentations. Among the speakers were representatives from Samsung, GM Korea, Pohang University of Science and Technology (POSTECH) and the Korea Institute of Materials Science (KIMS). They discussed the advantages of GOM optical metrology solutions and outlined how the systems have enabled them to optimize manufacturing processes while saving time and cutting costs at the same time.
We thank the entire OMA team for organizing the two-day conference, and we were very pleased to see so many participants in Daejeon. All of us are already looking forward to the next event.