In addition to the new ATOS Core scanner system, the ATOS Compact Scan 5M system for the production of precise 3D surface data and both the ARAMIS and the PONTOS system for the intuitive analysis of component behavior were on display, complemented by typical applications of these measuring systems. Presentations at the event illustrated the specific use and the individual customer benefit of the systems. The entire range of GOM systems demonstrated the growing need for full-field deformation measurement and the potential of high-end scanning and quality control of small and large objects.
We would like to thank the entire AIE team and VAMI (Vietnam Association of Mechanical Manufacturing Industry) for the organization and support of this event. Thanks to all guests for their interest and their lively discussions. We are looking forward to seeing you again at our next user meeting in Vietnam.