May 8-11, 2012
Stuttgart, Germany
Hall 3, Booth 3330
Exhibitor: GOM
At the leading international trade fair for quality assurance Control, GOM presents once again the whole range of its state-of-the-art sensor technology, efficient measuring and inspection software and tailor-made 3D metrology solutions.
At the show we will focus on:
Find out more about:
The automated 3D optical measuring machine offers high accuracy and high precision measurement with built in ATOS Triple Scan technology. The complete high quality solution is available off-the-shelf with short delivery times. The solution has been designed to offer maximum user, part and process safety. It is easy to use thanks to Virtual Measuring Room (VMR) and delivers quick, efficient and complete part information. The flexible, location independent measuring solution is not fixed to one location, and allows the measuring system to be truly mobile.
The ATOS Compact Scan defines a new class of scanner for 3D measurement and inspection. The lightweight, compact construction opens new application areas and ensures ultimate adaptability for 3-dimensional measuring of components.
Read more about the ATOS Compact Scan
The mobile 3D digitizer ATOS Triple Scan from GOM is equipped with an unique projection unit and utilizes the complete new 3-in-1 sensor concept. The system enables easier, faster and more reliable measuring and greatly reduces the number of single scans.
Find out more about the ATOS Triple Scan
GOM Inspect is a free 3D inspection and mesh processing software for dimensional analysis of 3D point clouds and viewer for ATOS and GOM Inspect Professional data sets.
Features of the free GOM Inspect software include
Find out more: GOM Inspect
The GOM measuring systems provide the right tools for the understanding of materials and components as they are independent from material, size and geometry. GOM's measuring systems consider the real component geometry which is not possible with traditional measuring devices and provide all results for static and dynamic tests even at high speeds for smallest to largest components.
Read more: Material & Component Testing