Optical Metrology 2009 is an international conference for integration of optical measuring techniques in industry and research. The conference is a unique event in bringing industry leaders together and offers a platform for managers, metrologists, technology and research experts to exchange application experiences.
The presentations and discussions concentrated on reducing product development times, enhancing process security and optimizing production procedures using optical 3D measurement.
Users presented their experiences with GOM systems and how GOM systems are being applied in industry and research. The complete GOM product range was exhibited and the GOM-Team was available for discussion and live demonstrations.
We would like to thank the over 400 participants and special thank you to the individual speakers for their informative presentations and exchange of experiences, helping to establish the GOM Conference as an annual high light within the area of optical metrology.
We will be sending a public version of the presentations to all participants in the near future. If you were unable to attend Optical Metrology 2009 but are interested in the presentations please send an email to conference|at|gom.com.
We look forward to welcoming interested managers, project leaders and metrologists from quality control, product development, deformation and material testing fields to the next international GOM Conference in autumn 2010.