New V7.5 Software release now available

I-Inspect combines maximum functionality with less complexity and more security, saving time during the inspection process.

I-Inspect offers a faster and safer inspection by simplifying the complete inspection workflow. Reducing complex inspection tasks to one single button, guiding the user, always offering correct software functions. I-Inspect filters intelligently commands which are not applicable and represents and powers the complete inspection commands.

GOM's established parametric inspection approach is applied to multiple data sets for trend, SPC and deformation analysis. This allows simple full-field data analysis in one project on multiple parts or stages and complete parametric inspection, changes in one part are applied to all other parts.

The GOM Software offers simple, powerful, full-field statistical process control and deformation analysis for applications such as: Series-accompanying body-in-white control; Comparison of different cavities from injection molding forms; Deformation analysis at different temperature states; Sample inspection of forming tools.

GOM has simplified the complete reporting process, speeding up creation while integrating GOMs parametric approach. The reporting module allows complete, clear and simple reports (snapshots, images, tables, text, ...) in just a few mouse clicks allowing quick creation, re-usable templates, high-quality and valuable information presentation in a intuitive user experience. Report pages can be easily annotated, problem areas highlighted & commented, page format quickly changed and a complete report exported into a transportable PDF format.

GOM Software, merges the full-field inspection world with the single point inspection world. Curvature, radii, flush, gap, etc provides the same advantages as full-field surfaces. This provides the maximum information for all inspection elements letting the user decide at any later point where detailed information should be displayed, i.e. single points for in depth analysis. This approach for curvature based inspection allows high information density even for point based inspection features.