International Student Competition on 3D Scanning

11/2016For the first time, GOM organizes the GOM Education Award – an international student competition on 3D scanning. The participants’ task is to prepare a lab experiment using the ATOS 3D scanner and to submit it in English by June 30, 2017.

The experiment should arouse interest in 3D metrology, explain the technology and include an application example. All submitted experiments will be evaluated by an expert jury. The winner or winning team receives the GOM Education Award endowed with EUR 3,000. Furthermore, the winner gets the unique opportunity to present the lab experiment at the GOM 3D Metrology Conference 2017 to industry representatives of renowned companies.

By offering the GOM Education Award, GOM fosters practice-oriented education in the field of 3D metrology. Full-field 3D scanning has become established as an industrial standard in reverse engineering and quality assurance. Furthermore, it forms the basis for Industry 4.0, as the complete 3D digitization of parts is a prerequisite for autonomous quality assurance during production processes.

Detailed information and registration at www.gom.com/education-award.html