GOM Conference 2010 sets new milestones in optical metrology

Optical Metrology 2010
Optical Metrology 2010
Optical Metrology 2010
Optical Metrology 2010

The 9th international GOM Conference - Optical Metrology 2010 took place from the 20th - 23rd September at the GOM headquarters in Braunschweig, Germany. The Conference welcomed over 500 visitors from more than 40 countries and the conference continues to be an annual high light within the area of optical metrology.

Optical Metrology is a unique event in bringing industry leaders together. The conference offers a platform for managers, metrologists, technology and research experts to exchange application experiences.

GOM proudly presented new milestones in form and dimension control including the new ATOS Triple Scan sensor generation, the parametric inspection software package GOM Inspect Professional and the newest concepts for automated inspection cell.

This years conference also offered visitors an insight into the use of GOM systems in industrial process chains and the integration of GOM system in finite element analysis and simulation, in particular in the area of deformation measurement for material and component testing as well as 3D motion analysis.

We would like to thank all participants and special thank you to the individual speakers for their informative presentations and exchange of experiences about the use of optical metrology for the reduction of development times, improvement of process safety and optimising production processes.

We look forward to welcoming interested managers, project leaders and metrologists from quality control, product development, deformation and material testing fields to the next international GOM Conference in spring 2012.

For more details please visit www.gom-conference.com.